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Model SN74BCT8374ADWE4
Description Scan Test Devices with OCTAL D-type EDG-TRIGGERED FLIP-FLOPS
Product QR code
Brand: TI
Packaging SOIC-24
Delivery time
Packaging method Tube, Rail
Standard packaging quantity 1
0yuan
  • Freight charges：   In stock Freight rate：$13.00
  • Quantity： Inventory(6792) Minimum order quantity(1)
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Technical parameters/frequency: 70.0 MHz

Technical parameters/power supply voltage (DC): 4.50V ~ 5.50V

Technical parameters/number of output interfaces: 8

Technical parameters/output current: 64.0 mA

Technical parameters/transmission delay time: 10.0 ns

Technical Parameters/Voltage Wave Node: 5.00 V

Technical parameters/output current drive: -234 µA

Encapsulation parameters/installation method: Surface Mount

Package parameters/number of pins: 24

Encapsulation parameters/Encapsulation: SOIC-24

External dimensions/packaging: SOIC-24

Other/Product Lifecycle: Active

Other/Packaging Methods: Tube, Rail

Compliant with standards/RoHS standards: RoHS Compliant

Compliant with standards/lead standards: Lead Free

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Alternative material

Model Brand Similarity Encapsulation Introduction Data manual
SN74BCT8374ADWRE4 SN74BCT8374ADWRE4 TI 完全替代 SOIC-24
与八D型边沿触发触发器扫描测试设备 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74BCT8374ANT SN74BCT8374ANT TI 完全替代 DIP-24
与八D型边沿触发触发器扫描测试设备 SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

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